Tuning sample length effect on mass transport in current carrying Cu-Si thin-film systems via interfacial engineering
نویسندگان
چکیده
منابع مشابه
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ژورنال
عنوان ژورنال: Nanotechnology
سال: 2019
ISSN: 0957-4484,1361-6528
DOI: 10.1088/1361-6528/ab3d5c